The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

May. 24, 2018
Applicant:

Oerlikon Metco (Us) Inc., Westbury, NY (US);

Inventors:

Ronald J. Molz, Farmingville, NY (US);

Dave Hawley, Westbury, NY (US);

Samrawit Hermosillo, Santa Clara, CA (US);

Jose Colmenares, Malverne, NY (US);

Assignee:

OERLIKON METCO (US) INC., Westbury, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05H 1/34 (2006.01); G06F 17/14 (2006.01); G01F 1/66 (2022.01);
U.S. Cl.
CPC ...
G06F 17/142 (2013.01); H05H 1/34 (2013.01); G01F 1/66 (2013.01); H05H 1/3494 (2021.05);
Abstract

Method and apparatus for monitoring and diagnosing gun performance is derived that can determine proper gun operation and if not operating properly diagnose potential causes for abhorrent operation. The voltage produced by the gun is sampled in real time and the frequency spectrum produced analyzed using FFT and then reducing the FFT pattern down to a set of numerical values or a signature that can be compared to known signatures for both correct operation and abnormal operation. Using best fit techniques the cause of any abnormal behavior can then be identified. The method can also be used to predict the end of hardware life and aid in production scheduling and spare parts acquisition by providing advanced notice of wear and usage.


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