The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2023
Filed:
Nov. 29, 2018
Applicant:
Omron Corporation, Kyoto, JP;
Inventors:
Tetsuji Yamato, Yokohama, JP;
Taiji Yoshikawa, Kizugawa, JP;
Assignee:
OMRON Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/215 (2019.01); G06F 16/907 (2019.01); G06F 11/30 (2006.01); G06F 16/2455 (2019.01); G06F 16/383 (2019.01); H04L 67/12 (2022.01);
U.S. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 11/3089 (2013.01); G06F 16/24565 (2019.01); G06F 16/383 (2019.01); G06F 16/907 (2019.01); H04L 67/12 (2013.01);
Abstract
A quality check apparatus, a quality check method, and a quality check program can check the quality of input data output to a processing module. A device outputs the input data and first metadata indicating an attribute regarding the quality of the input data to the processing module. The quality check apparatus includes a first obtaining unit and a check unit. The first obtaining unit obtains the first metadata. The check unit checks the quality of the input data based on the first metadata.