The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2023
Filed:
Mar. 16, 2020
International Business Machines Corporation, Armonk, NY (US);
Andrew C. M. Hicks, Wappingers Falls, NY (US);
Ryan Thomas Rawlins, New Paltz, NY (US);
Dale E. Blue, Poughkeepsie, NY (US);
Kevin Minerley, Red Hook, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for testing a system under test (SUT) in an active environment includes receiving, by a testing system, a code path of the SUT that causes a soft failure in the active environment. The soft failure occurs in the active environment during execution of the SUT based at least on a parameter of the active environment. The method further includes generating, by the testing system, multiple tests for testing the SUT, the tests generated based on a coverage model of the SUT, wherein the coverage model uses several attributes. The method further includes selecting, by the testing system, from the generated tests, a set of tests that are associated with the code path. The method further includes executing, by the testing system, only the set of tests that are selected on the SUT to analyze a cause of the soft failure.