The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2023
Filed:
Oct. 14, 2020
Netapp, Inc., Sunnyvale, CA (US);
Tyler W. Cady, Denver, CO (US);
Joseph R. Thomas, III, Broomfield, CO (US);
NetApp, Inc., San Jose, CA (US);
Abstract
Systems and methods for enhancing the representation of outliers in a distribution of telemetry data of a monitored system are provided. According to one embodiment, telemetry data of the monitored system may be continuously collected. Frequency values representing a frequency of occurrence of corresponding telemetry data of the collected telemetry data may be generated by aggregating the collected telemetry data. As the vast majority of telemetry data is expected to represent a normal operating state of the system and relatively few, if any, of the telemetry data (e.g., outliers) will be indicative of one or more events of significance, the resulting distribution of the frequency values is highly skewed. In order to facilitate visualization of the distribution that accentuates the outliers, display characteristics may be calculated for the frequency values by applying a visualization model based on a weighted combination of multiple data transformations to each of the frequency values.