The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

May. 14, 2020
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Hsin-Chi Chen, Taichung, TW;

Chuang-Hua Chueh, Taipei, TW;

Chun-Fang Chen, Hukou Township, Hsinchu County, TW;

Chi-Heng Lin, Taichung, TW;

Chun-Hsu Chen, Hukou Township, Hsinchu County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G05B 23/02 (2006.01); G05B 19/048 (2006.01); G05B 19/04 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0227 (2013.01); G05B 19/0405 (2013.01); G05B 19/048 (2013.01); G06F 11/008 (2013.01);
Abstract

A data processing system, including a cyclic correlation establishing module, a data pattern establishing module, and a data pattern alignment module, is provided. The cyclic correlation establishing module receives a plurality of first sensor data, obtained from a first sensor operation performed on processing devices, and receives a table of processing steps and cyclic procedures. The cyclic correlation establishing module obtains a data correlation of the first sensor data according to the number of sample points in a data cycle of the first sensor data and the table to correct the first sensor data. The data pattern establishing module obtains a plurality of first data pattern features from the first sensor data. The data pattern alignment module aligns a plurality of second sensor data obtained from a second sensor operation performed on the processing devices with the first sensor data according to the first data pattern features.


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