The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

Oct. 07, 2019
Applicant:

Sick Ag, Waldkirch, DE;

Inventors:

Sebastian Pastor, Waldkirch, DE;

Kay Fürstenberg, Waldkirch, DE;

Assignee:

SICK AG, Waldkirch, DE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 17/04 (2020.01); G02B 26/10 (2006.01); G01S 7/481 (2006.01); G01S 17/89 (2020.01); G02B 27/10 (2006.01);
U.S. Cl.
CPC ...
G02B 26/101 (2013.01); G01S 7/4817 (2013.01); G01S 17/04 (2020.01); G01S 17/89 (2013.01); G02B 27/10 (2013.01);
Abstract

The invention relates to an optoelectronic sensor for detecting objects in a monitored zone that has a light transmitter; a deflection unit for deflecting the transmission light beam without mechanical moving parts or at most with micromechanical moving parts to scan the monitored zone; a light receiver; and a control and evaluation unit that is configured to determine information on the objects by means of the reception signal received by the light receiver. The sensor has at least one reference target that receives at least a portion of the deflected transmission light beam at at least one deflection angle of the deflection unit or returns it to the light receiver in order to generate a reference signal; and the control and evaluation unit is configured to check the operability of the deflection unit by means of the reference signal.


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