The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2023
Filed:
Oct. 29, 2020
S.d. Sight Diagnostics Ltd., Tel Aviv, IL;
Noam Yorav-Raphael, Tekoa, IL;
Joseph Joel Pollak, Neve Daniel, IL;
Sarah Levy Schreier, Jaffa, IL;
Yochay Shlomo Eshel, Sde Warburg, IL;
S.D. Sight Diagnostics Ltd., Tel Aviv, IL;
Abstract
Apparatus and methods are described for determining a property of a bodily sample using a microscope and optical-density-measurement apparatus, the apparatus including a sample carrier that includes a plurality of microscopy sample chambers configured to receive a first portion of the sample and to facilitate imaging of the first portion of the sample by the microscope, each of the microscopy sample chambers having an upper and a lower surface, and having respective heights between the upper and lower surfaces that are different from each other. The sample carrier includes at least one optical-density-measurement chamber configured to receive a second portion of the sample, and to facilitate optical density measurements being performed optical-density-measurement apparatus upon the second portion of the sample. Other applications are also described.