The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

Sep. 24, 2020
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Thorsten Feiweier, Poxdorf, DE;

Michael Köhler, Nuremberg, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/48 (2006.01); G01R 33/54 (2006.01); G01R 33/38 (2006.01); G01R 33/385 (2006.01);
U.S. Cl.
CPC ...
G01R 33/3804 (2013.01); G01R 33/543 (2013.01); G01R 33/3852 (2013.01); G01R 33/3856 (2013.01);
Abstract

In a method for providing setting parameter sets for at least one measuring protocol described by protocol parameters for acquiring magnetic resonance data with a magnetic resonance facility, setting parameter set is determined for each of at least two temperature status categories of the magnetic resonance facility using a temperature model describing a development of a temperature status of at least one component of the magnetic resonance facility. The method also includes preventing overheating of the at least one component due to the measurement with the measuring protocol being repeated a maximum number of times for a specified number of repetitions.


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