The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

May. 14, 2020
Applicant:

Colorado State University Research Foundation, Fort Collins, CO (US);

Inventors:

Thomas C. Sale, Bellvue, CO (US);

Kayvan Karimi Askarani, Fort Collins, CO (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 25/00 (2006.01); G01N 25/48 (2006.01); G01N 33/24 (2006.01); G01K 3/10 (2006.01);
U.S. Cl.
CPC ...
G01N 25/4866 (2013.01); G01K 3/10 (2013.01); G01N 25/4853 (2013.01); G01N 33/24 (2013.01);
Abstract

A subsurface monitoring system and method is provided for measuring a rate of change in an amount of a reactive material within a subsurface formation using measurements of thermal parameters at one or more positions within the subsurface without the need for background correction which may lead erroneous calculations and require additional monitoring equipment. The measured thermal parameters may be used to determine the heat generated by the degradation of the reactive material. The method may include measuring a first temperature near the surface of a subsurface region and a second temperature further from the surface. In some instances, an estimated location of a planar subsurface heat source/sink due to exothermic degradation reactions within the subsurface may be selected. With the derived thermal parameters and the estimated location of the subsurface heat source/sink, change rates for the reactive materials in the subsurface region may be determined or estimated.


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