The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2023
Filed:
Sep. 27, 2018
Topcon Corporation, Tokyo, JP;
Riken, Wako, JP;
Yuichi Yoshimura, Tokyo, JP;
Maki Mizuta, Wako, JP;
Hideyuki Sunaga, Wako, JP;
Yoshie Otake, Wako, JP;
Topcon Corporation, Tokyo, JP;
RIKEN, Wako, JP;
Abstract
The non-destructive inspection method includes: a water absorbing or drying step of changing a water-content state of a test piece; a transmission image capturing step of irradiating, with a radiation, the test piece absorbed water or dried for a predetermined time in the water absorbing or drying step and capturing a transmission image created by visualizing the radiation transmitted through the test piece; and an evaluation step of evaluating the test piece on the basis of the water-content state of the test piece determined from the transmission image captured in the transmission image capturing step.