The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2023
Filed:
Sep. 26, 2018
Hamamatsu Photonics K.k., Hamamatsu, JP;
Masashi Fukuhara, Hamamatsu, JP;
Kazuhiko Fujiwara, Hamamatsu, JP;
Yoshihiro Maruyama, Hamamatsu, JP;
HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;
Abstract
A spectrum analysis apparatus is an apparatus for analyzing an analysis object on the basis of a spectrum of light generated in the analysis object containing any one or two or more of a plurality of reference objects, and includes an array conversion unit, a processing unit, a learning unit, and an analysis unit. The array conversion unit generates two-dimensional array data on the basis of a spectrum of light generated in the reference object or the analysis object. The processing unit includes a deep neural network. The analysis unit causes the array conversion unit to generate the two-dimensional array data on the basis of the spectrum of light generated in the analysis object, inputs the two-dimensional array data to the deep neural network, and analyzes the analysis object on the basis of data output from the deep neural network.