The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2023
Filed:
May. 14, 2020
Applicant:
Xtal Concepts Gmbh, Hamburg, DE;
Inventors:
Assignee:
Xtal Concepts GmbH, Hamburg, DE;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01); G01N 23/06 (2018.01); G01N 1/42 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0211 (2013.01); G01N 15/02 (2013.01); G01N 15/0205 (2013.01); G01N 23/06 (2013.01); G01N 1/42 (2013.01); G01N 2015/0222 (2013.01); G01N 2223/04 (2013.01); G01N 2223/3103 (2013.01);
Abstract
A qualification process for a sample to be examined by means of cryo-electron microscopy. The, sample () is applied to a sample carrier () provided for cryo-electron microscopy and subsequently the sample () arranged on the sample carrier is examined by means of dynamic light scattering. The particle size distribution within the sample () is determined by means of the dynamic light scattering. Further, a sample holder designed to carry out the qualification process.