The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

Feb. 13, 2017
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventor:

Gereon Vogtmeier, Aachen, DE;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61F 2/30 (2006.01); A61B 5/107 (2006.01); A61B 6/00 (2006.01); A61F 2/28 (2006.01); G09B 23/30 (2006.01); A61B 6/03 (2006.01); A61B 34/10 (2016.01);
U.S. Cl.
CPC ...
A61F 2/30942 (2013.01); A61B 5/107 (2013.01); A61B 6/032 (2013.01); A61B 6/505 (2013.01); A61B 6/52 (2013.01); A61B 6/5205 (2013.01); A61B 6/5217 (2013.01); A61B 6/545 (2013.01); A61B 34/10 (2016.02); A61F 2/28 (2013.01); G09B 23/30 (2013.01); A61B 6/482 (2013.01); A61B 6/484 (2013.01); A61B 2034/105 (2016.02); A61F 2002/30948 (2013.01); A61F 2002/30962 (2013.01);
Abstract

In one aspect of the invention a system and method is claimed for providing model parameters for three dimensional fabrication of anatomical structures by obtaining and reconstructing three dimensional image data with a medical imager wherein imaging acquisition parameters of the imaging system and/or reconstruction input parameters of the reconstructor are optimized for maximum geometry precision. Advantageously, the imaging system is further configured to obtain material and/or functional information of the anatomical structure model and that material information is used to incorporate the material information in the anatomical model.


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