The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2023
Filed:
Jun. 14, 2021
Eosdx Inc., Mountain View, CA (US);
Pavel Lazarev, Menlo Park, CA (US);
Alexander Lazarev, Lake Forest, CA (US);
EosDx Inc., Mountain View, CA (US);
Abstract
Provided herein are diffractometer-based global in situ diagnostic systems and uses thereof. The systems may comprise one or more tissue diffractometers that are configured for acquiring in situ diffraction data for a subject, e.g., a patient, and that are operatively coupled to a computer database over a network. The one or more tissue diffractometers may be configured for transfer of data such as image data, diffraction pattern data, subject data, or any combination thereof to the computer database over the network. The systems may further comprise one or more computer processors operatively coupled to the tissue diffractometers, which computer processors may be configured to receive the data from the tissue diffractometers, transmit the data to the computer database, and process the data using a data analytics algorithm which may provide a computer-aided diagnostic indicator for the individual subject.