The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

Nov. 15, 2017
Applicant:

Cornell University, Ithaca, NY (US);

Inventors:

Chris Xu, Ithaca, NY (US);

Kriti Charan, Freeville, NY (US);

Bo Li, Ithaca, NY (US);

Michael Buttolph, Ithaca, NY (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/04 (2006.01); A61B 5/00 (2006.01); H01S 3/067 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/40 (2013.01); A61B 5/0071 (2013.01); G02B 21/0032 (2013.01); H01S 3/06754 (2013.01); G01N 2201/0697 (2013.01);
Abstract

A system and method for adaptive illumination, the imaging system comprising an excitation source having a modulator, which generates a pulse intensity pattern having a first wavelength when the excitation source receives a modulation pattern. The modulation pattern is a data sequence of a structural image of a sample. An amplifier of the imaging system is configured to receive and amplify the pulse intensity pattern from the modulator. A frequency shift mechanism of the imaging system shifts the first wavelength of the pulse intensity pattern to a second wavelength. A laser scanning microscope of the imaging system receives the pulse intensity pattern having the second wavelength.


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