The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

May. 19, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Kun Sun Eom, Yongin-si, KR;

Sung Hyun Nam, Yongin-si, KR;

Moon Seong Park, Suwon-si, KR;

Yun S Park, Suwon-si, KR;

Myoung Hoon Jung, Bucheon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/0537 (2021.01); A61B 5/0531 (2021.01); A61B 5/145 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0537 (2013.01); A61B 5/0531 (2013.01); A61B 5/14532 (2013.01); A61B 5/14546 (2013.01); A61B 5/6844 (2013.01); A61B 2562/043 (2013.01);
Abstract

A component analyzing apparatus is provided. The component analyzing apparatus includes: an impedance measurer including: a plurality of electrodes having an electrode width that is determined based on an effective measurement depth for analyzing a component of an analyte and a gap between two electrodes among the plurality of electrodes, and an electrode controller configured to apply a first current to a first electrode and a second electrode among the plurality of electrodes and configured to measure impedance based on a voltage between a third electrode and a fourth electrode; and a processor configured to analyze the component of the analyte based on the impedance measured by the electrode controller.


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