The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2023

Filed:

Aug. 27, 2021
Applicant:

Tencent America Llc, Palo Alto, CA (US);

Inventors:

Birendra Kathariya, Roeland Park, KS (US);

Sehoon Yea, Palo Alto, CA (US);

Arash Vosoughi, San Jose, CA (US);

Shan Liu, San Jose, CA (US);

Assignee:

TENCENT AMERICA LLC, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 19/132 (2014.01); H04N 19/103 (2014.01); H04N 19/124 (2014.01); G06T 9/40 (2006.01);
U.S. Cl.
CPC ...
H04N 19/132 (2014.11); G06T 9/40 (2013.01); H04N 19/103 (2014.11); H04N 19/124 (2014.11);
Abstract

A method of adaptive point cloud attribute coding is performed by at least one processor and includes determining a centroid of k candidate points of a point cloud, k being a predetermined sampling rate of all points of the point cloud, and selecting one of the k candidate points that is closest to the centroid. The method further includes determining a first levels-of-detail (LoD) layer comprising the one of the k candidate points, and a second LoD layer without the one of the k candidate points, and performing coding of attributes of the all points, based on the first LoD layer and the second LoD layer.


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