The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2023

Filed:

Aug. 12, 2014
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventor:

Vikram VijayanBabu Appia, Dallas, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/31 (2006.01); G03B 21/14 (2006.01);
U.S. Cl.
CPC ...
H04N 9/3185 (2013.01); G03B 21/147 (2013.01); H04N 9/3173 (2013.01); H04N 9/3194 (2013.01);
Abstract

A method for automatic keystone correction in a projection system is provided that includes rectifying a first image to be projected using current keystone correction parameters to generate a first rectified image, projecting, by a projector in the projection system, the first rectified image on a projection surface, determining whether or not current keystone correction parameters are providing sufficient keystone correction after the first rectified image is projected, rectifying a second image to be projected using the current keystone correction parameters to generate a second rectified image if the current keystone correction parameters are providing sufficient keystone correction, computing new keystone correction parameters if the current keystone correction parameters are not providing sufficient keystone correction and rectifying the second image to be projected using the new keystone correction parameters to generate the second rectified image, and projecting, by the projector, the second rectified image on the projection surface.


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