The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2023

Filed:

Oct. 06, 2020
Applicant:

Element Ai Inc., Montreal, CA;

Inventor:

Negin Sokhandan Asl, Montreal, CA;

Assignee:

SERVICENOW CANADA INC., Montreal, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06V 20/52 (2022.01); G06K 9/62 (2022.01); G06Q 10/087 (2023.01); G06N 3/04 (2023.01); G06N 3/08 (2023.01); G06Q 30/018 (2023.01);
U.S. Cl.
CPC ...
G06V 20/52 (2022.01); G06K 9/627 (2013.01); G06K 9/628 (2013.01); G06K 9/6232 (2013.01); G06K 9/6262 (2013.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06Q 10/087 (2013.01); G06Q 30/0185 (2013.01);
Abstract

Systems and methods for monitoring product placement. The method comprises accessing a first image depicting a plurality of items arranged in accordance with a first layout, accessing a second image, the second image depicting at least some of the plurality of items arranged in accordance with a second layout. The method then proceeds to inputting, to a machine learning algorithm (MLA), a first density map and a second density map, the first density map having been generated from the first image and the second density map having been generated from the second image. An anomaly map is then outputted by the ML, the anomaly map comprising a first indication of an item class associated with an anomaly and a second indication of a position associated with the anomaly.


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