The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2023

Filed:

May. 20, 2022
Applicant:

Cnh Industrial America Llc, New Holland, PA (US);

Inventors:

Bart M. A. Missotten, Herent, BE;

Thomas Mahieu, Vleteren, BE;

Assignee:

CNH Industrial America LLC, New Holland, PA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/62 (2017.01); G06T 7/00 (2017.01); A01D 41/127 (2006.01);
U.S. Cl.
CPC ...
G06T 7/62 (2017.01); A01D 41/1277 (2013.01); G06T 7/0004 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30208 (2013.01);
Abstract

A device for analyzing a grain sample including a light source, an image sensor, and a controller. The light source is configured for illuminating the grain sample. The image sensor is configured for capturing images of the grain sample. The controller is coupled to the image sensor and is configured for receiving the images of the grain sample therefrom and for analyzing the images to detect at least one material other than grain in the grain sample. The light source is configured for illuminating the grain sample with a local light spot having a size that is smaller than a width of an average wheat kernel. The image analysis and the detection of material other than grain may, at least partly, be performed using trained neural networks and other artificial intelligence algorithms.


Find Patent Forward Citations

Loading…