The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2023

Filed:

Aug. 28, 2019
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Wei Cheng, Princeton Junction, NJ (US);

LuAn Tang, Pennington, NJ (US);

Dongjin Song, Princeton, NJ (US);

Bo Zong, West Windsor, NJ (US);

Haifeng Chen, West Windsor, NJ (US);

Jingchao Ni, Princeton, NJ (US);

Wenchao Yu, Plainsboro, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G06N 5/02 (2006.01); G06N 3/049 (2023.01);
U.S. Cl.
CPC ...
G06N 3/049 (2013.01); G06N 3/08 (2013.01); G06N 5/02 (2013.01);
Abstract

Systems and methods for predicting system device failure are provided. The method includes representing device failure related data associated with the devices from a predetermined domain by temporal graphs for each of the devices. The method also includes extracting vector representations based on temporal graph features from the temporal graphs that capture both temporal and structural correlation in the device failure related data. The method further includes predicting, based on the vector representations and device failure related metrics in the predetermined domain, one or more of the devices that is expected to fail within a predetermined time.


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