The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2023

Filed:

Aug. 21, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Won-joo Jung, Bucheon-si, KR;

Jang-woo Lee, Seoul, KR;

Byung-hoon Jeong, Hwaseong-si, KR;

Jeong-don Ihm, Seongnam-si, KR;

Assignee:

Samsung Electronics Co, Ltd., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 11/07 (2006.01); G06K 9/62 (2022.01); G06F 13/16 (2006.01); G06F 1/10 (2006.01); G06F 12/0882 (2016.01);
U.S. Cl.
CPC ...
G06F 11/3037 (2013.01); G06F 1/10 (2013.01); G06F 11/0757 (2013.01); G06F 12/0882 (2013.01); G06F 13/1673 (2013.01); G06K 9/6257 (2013.01);
Abstract

A memory device includes a path state check circuit configured to check states of signal transmission paths, each signal transmission path including a data transmission path and a clock transmission path of the memory device. The path state check circuit includes a sampling circuit configured to perform a sampling operation by using pattern data that has passed through the data transmission path and a clock signal that has passed through the clock transmission path, and generate sample data, and a management circuit configured to generate a comparison of the sample data with the pattern data and manage check result information indicating whether a re-training operation for the memory device is to be performed, based on a result of the comparison.


Find Patent Forward Citations

Loading…