The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2023

Filed:

Nov. 21, 2018
Applicant:

Johnson Controls Tyco Ip Holdings Llp, Milwaukee, WI (US);

Inventors:

Sugumar Murugesan, Santa Clara, CA (US);

Young M. Lee, Old Westbury, NY (US);

ZhongYi Jin, Santa Clara, CA (US);

Jaume Amores, Cork, IE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 13/04 (2006.01); F24F 11/38 (2018.01); F24F 11/63 (2018.01); G06N 20/00 (2019.01); G05B 13/02 (2006.01); F24F 11/64 (2018.01); G06N 5/04 (2006.01);
U.S. Cl.
CPC ...
G05B 13/048 (2013.01); F24F 11/38 (2018.01); F24F 11/63 (2018.01); F24F 11/64 (2018.01); G05B 13/0265 (2013.01); G05B 13/04 (2013.01); G06N 20/00 (2019.01); G05B 13/027 (2013.01); G05B 13/028 (2013.01); G06N 5/04 (2013.01);
Abstract

A chiller threshold management system for a building, including one or more memory devices and one or more processors. The one or more memory devices are configured to store instructions to be executed on the one or more processors. The one or more processors are configured to determine whether chiller fault data exists in chiller data used to generate a plurality of chiller prediction models. The one or more processors are further configured to generate a first threshold evaluation value for each of the plurality of chiller prediction models using a first evaluation technique in response to a determination that chiller fault data exists in the chiller data, and generate a second threshold evaluation value for each of the chiller prediction models using a second evaluation technique in response to a determination that chiller fault data does not exist in the chiller data. The one or more processors are configured to select a first threshold for each of the plurality of chiller prediction models based on the first threshold evaluation values in response to the determination that chiller fault data exists in the chiller data, and select a second threshold for each of the plurality of chiller prediction models based on the second threshold evaluation values in response to the determination that chiller fault data does not exist in the chiller data.


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