The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2023

Filed:

Dec. 30, 2021
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Wilson Pradeep, Bangalore, IN;

Sriraj Chellappan, Bangalore, IN;

Shruti Gupta, Bangalore, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/3177 (2006.01); G11C 19/28 (2006.01); H03K 19/20 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31727 (2013.01); G01R 31/3177 (2013.01); G11C 19/287 (2013.01); H03K 19/20 (2013.01);
Abstract

An integrated circuit for transition fault testing comprises a synchronizing circuit including a first set of shift registers coupled to receive a scan enable signal and to provide a synchronizing signal based on the scan enable signal; a clock leaker circuit coupled to the synchronizing circuit and including a second set of shift registers coupled to receive a first clock signal based on the synchronizing signal and to provide a second clock signal that includes a set of pulses; and a multiplexer (MUX) that includes a first input coupled to receive a shift clock, a second input coupled to the clock leaker circuit to receive the second clock signal, and an output configured to provide an output clock signal that includes a second set of pulses.


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