The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2023

Filed:

Jun. 02, 2021
Applicant:

Meta Platforms, Inc., Menlo Park, CA (US);

Inventors:

Pradip Sairam Pichumani, Bellevue, WA (US);

Sandeep Rekhi, San Jose, CA (US);

Howard Lee Davidson, San Mateo, CA (US);

Assignee:

Meta Platforms, Inc., Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 31/28 (2006.01); G01R 1/07 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06705 (2013.01); G01R 1/071 (2013.01); G01R 1/07392 (2013.01); G01R 31/2808 (2013.01); G01R 31/2817 (2013.01);
Abstract

The disclosed apparatus may include support portions, a frame (such as a base) configured to maintain the support portions in a spaced-apart configuration, a sample holder configured to receive a sample, and a probe assembly including micromanipulators configured to position one or more probes in contact with the sample. The sample holder may rotate between the support portions, and the probe assembly may rotate with the sample holder so that the one or more probes may maintain contact with a sample in the sample holder as the sample holder is rotated, for example, to expose a portion of the sample for processing. Various other methods, systems, and computer-readable media are also disclosed.


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