The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2023
Filed:
Dec. 15, 2020
Guangzhou Municipal Engineering Testing Co., Ltd., Guangzhou, CN;
Guangzhou Construction Engineering Co., Ltd., Guangzhou, CN;
Guangzhou Municipal Construction Group Co., Ltd., Guangzhou, CN;
Mengxiong Tang, Guangzhou, CN;
Zhiguo Zhou, Guangzhou, CN;
Xiaoli Sun, Guangzhou, CN;
Hongye Wang, Guangzhou, CN;
Jun Yang, Guangzhou, CN;
Hesong Hu, Guangzhou, CN;
Wuyang Zhou, Guangzhou, CN;
Decun Bian, Guangzhou, CN;
Yayu Zhao, Guangzhou, CN;
Jixi Shao, Guangzhou, CN;
Ducheng Guo, Guangzhou, CN;
Hongbin Zhao, Guangzhou, CN;
GUANGZHOU MUNICIPAL ENGINEERING TESTING CO., LTD., Guangzhou, CN;
GUANGZHOU CONSTRUCTION ENGINEERING CO., LTD., Guangzhou, CN;
GUANGZHOU MUNICIPAL CONSTRUCTION GROUP CO., LTD., Guangzhou, CN;
Abstract
Provided is an apparatus and method for detecting grout compactness in grouted splice sleeve, the apparatus comprises a probe assembly, which comprises at least one of capacitive probe and piezoelectric sensor and is arranged inside the grouted splice sleeve to detect parameters of the sleeve during grouting and curing and a detector, which comprises at least an analysis module that is connected with the probe assembly to obtain the detected parameters and carry out calculation and analysis for the parameters. The probe assembly is arranged inside the grouted splice sleeve and forms a loop with the detector during grouting, such that during the process of grouting, the detected parameters will be changed as the surrounding dielectric changes, therefore, the detector may determine in real time whether the grouted splice sleeve is fully grouted by calculating and analyzing the detected parameters, which achieves a faster and easier grout compactness detection.