The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2023

Filed:

Oct. 01, 2020
Applicant:

Institut National DE LA Recherche Scientifique, Quebec, CA;

Inventors:

Riccardo Piccoli, Montreal, CA;

Luca Razzari, Mont-Royal, CA;

Luca Zanotto, Montreal, CA;

Junliang Dong, Longueuil, CA;

Roberto Morandotti, Montreal, CA;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/3581 (2014.01); G01N 21/21 (2006.01); H04N 5/30 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3581 (2013.01); G01N 21/21 (2013.01); H04N 5/30 (2013.01); G01N 2201/0683 (2013.01); G01N 2201/06113 (2013.01);
Abstract

Real-time multidimensional terahertz imaging system and method, the method comprising method for imaging an object, comprising, in a laser pump line: patterning a laser pump beam with known patterns of a radiation beam and illuminating the object with the radiation beam; yielding a patterned pump beam; directing the patterned beam from the pump line and a laser probe beam from a laser probe line to a detection crystal; single-shot detection of the radiation beam waveform; and correlating the single-shot detection and the known patterns.


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