The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2023

Filed:

Sep. 04, 2020
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Venkata Vijayaraghava Nalladega, Watervliet, NY (US);

Bernard Patrick Bewlay, Niskayuna, NY (US);

Majid Nayeri, Niskayuna, NY (US);

Michael Howard Rucker, Cincinnati, OH (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 25/72 (2006.01); F01D 5/28 (2006.01); C23C 28/00 (2006.01); F01D 5/18 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
C23C 28/00 (2013.01); F01D 5/182 (2013.01); F01D 5/288 (2013.01); G01N 21/8851 (2013.01); G01N 25/72 (2013.01);
Abstract

Systems and methods for automatic detection of defects in a coating of a component are provided. In one aspect, a coating inspection system is provided. The coating inspection system includes a heating element operable to impart heat to the component as it traverses relative thereto. An imaging device of the system captures images of the component as the heating element traverses relative to the component and applies heat thereto. The images indicate the transient thermal response of the component. The system can generate a single observation image using the captured images. The system can detect and analyze defects using the generated single observation image.


Find Patent Forward Citations

Loading…