The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2023
Filed:
Jun. 24, 2019
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Toru Sasaki, Yokohama, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); C12Q 1/6851 (2018.01);
U.S. Cl.
CPC ...
C12Q 1/6851 (2013.01); G06T 7/0012 (2013.01); G06T 2207/10064 (2013.01); G06T 2207/30072 (2013.01);
Abstract
Provided is a particle measuring method for measuring, based on image data containing an image of a plurality of particles, a size of each of the particles included in the image data. The particle measuring method includes: acquiring a position of each of the plurality of particles from the image data; extracting two particles vicinal to each other; and calculating the size of each of the particles based on a distance between the two vicinal particles.