The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2023
Filed:
Jun. 02, 2022
C. Bruce Banter, Northville, MI (US);
C. Bruce Banter, Northville, MI (US);
Other;
Abstract
The wheal and flare analyzing system analyzes the mast cell reaction to an allergen being administered in a scratch or prick skin test. The system comprises a sensor array and a processing unit. The sensor array includes a plurality of emitters surrounding a receiver at the allergen test site. Energy of various wavelengths is emitted into the allergen test site. An energy receiver measures reflected various wavelengths from the plurality of emitters. A microprocessor is in digital communication with the plurality of emitters and the energy receiver. The reflected wavelengths have an energy return indicative of the intensity of the allergic reaction in the mast cells. The intensity of the allergic reaction is analyzable from the reflected wavelengths and other data over time. A plurality of temperature sensors measuring local dermal temperatures surrounding the sensor array, the local dermal temperature being indicative of the intensity of the allergic reaction.