The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2023
Filed:
Jul. 24, 2020
Viavi Solutions Inc., San Jose, CA (US);
Craig Stephen Boledovic, Walkersville, MD (US);
Maxime Gatti, Saint Etienne, FR;
Andrew Thomas Rayno, Frederick, MD (US);
VIAVI SOLUTIONS INC., Chandler, AZ (US);
Abstract
A modular test instrument for performing tests and measurements in a network is disclosed. The modular test instrument may include a modular processing unit comprising a processor and memory, the modular processing unit connectable to at least one modular test unit or modular test subunit. The modular test instrument may also include a modular display unit connectable to the modular processing unit or the modular test unit. Display modularity may enable quick and cost-efficient display replacement when damage, malfunction, or failure is incurred. Furthermore, the modular test instrument may include an additional modular test subunit connectable to at least one of the modular processing unit or the modular test unit. When the modular processing unit is fitted with the modular display unit, the modular least, or modular test subunit, for example, the modular test instrument may form an integrated test instrument for performing any number of tests and measurements associated with installation, troubleshooting, or maintenance of a long-term evolution (LTE) or 5G network.