The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Aug. 11, 2020
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Vikram VijayanBabu Appia, Dallas, TX (US);

Ibrahim Ethem Pekkucuksen, Dallas, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/106 (2018.01); G06T 3/40 (2006.01); H04N 13/243 (2018.01); H04N 13/25 (2018.01); H04N 13/282 (2018.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
H04N 13/106 (2018.05); G06T 3/4053 (2013.01); H04N 13/243 (2018.05); H04N 13/25 (2018.05); H04N 13/282 (2018.05); H04N 2013/0081 (2013.01);
Abstract

A method of image processing in a structured light imaging device is provided that includes capturing a plurality of images of a scene into which a structured light pattern is projected by a projector in the structured light imaging device, extracting features in each of the captured images, finding feature matches between a reference image of the plurality of captured images and each of the other images in the plurality of captured images, rectifying each of the other images to align with the reference image, wherein each image of the other images is rectified based on feature matches between the image and the reference image, combining the rectified other images and the reference image using interpolation to generate a high resolution image, and generating a depth image using the high resolution image.


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