The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

May. 25, 2021
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Akira Sano, Matsumoto, JP;

Shinji Kubota, Ina, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/31 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
H04N 9/3194 (2013.01); G01J 3/2823 (2013.01); H04N 9/3158 (2013.01); H04N 9/3182 (2013.01);
Abstract

A control method of a spectroscopic imaging device including an imaging element and a spectral element, the control method includes causing the spectroscopic imaging device to generate a first measurement spectrum consisting of N1 wavelengths by imaging a target object by making output wavelengths of a spectral element different when the spectroscopic imaging device is in a high accuracy mode and causing the spectroscopic imaging device to generate a second measurement spectrum consisting of N2 wavelengths by imaging the target object by making the output wavelengths of the spectral element different when the spectroscopic imaging device is in a high speed mode, in which N1 is an integer greater than or equal to two, and N2 is an integer less than N1.


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