The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Jan. 03, 2022
Applicant:

Meta Platforms, Inc., Menlo Park, CA (US);

Inventors:

Brian Dunn, Menlo Park, CA (US);

Krishna Srikanth Gomadam, San Jose, CA (US);

Djordje Tujkovic, Mountain View, CA (US);

Assignee:

Meta Platforms, Inc., Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/06 (2006.01); H04B 17/336 (2015.01); H04B 7/08 (2006.01);
U.S. Cl.
CPC ...
H04B 7/0626 (2013.01); H04B 7/0617 (2013.01); H04B 7/0857 (2013.01); H04B 17/336 (2015.01);
Abstract

Apparatuses, methods, and systems for coordinated beamforming in a wireless mesh network, are disclosed. One system includes a network that includes a plurality of nodes connected through wireless links, and a controller. The wireless links including aggressor links and victim links wherein the aggressor links interfere with the victim links. The controller is operative to identify aggressor links and victim links of a group of nodes of the plurality of nodes, coordinate beam scans of the one or more victim receive nodes associated with the victim links of the group, coordinate transmission of one or more aggressor transmit nodes associated with the aggressor links of the group, characterize or receive characterizations of measured interference at the one or more victim receive nodes during the coordinated beam scans, and select beamforming coefficients for the victim receive nodes based at least on the characterizations of the measured interference.


Find Patent Forward Citations

Loading…