The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2023
Filed:
Oct. 13, 2021
Tmy Technology Inc., Taipei, TW;
Su-Wei Chang, Taipei, TW;
Chueh-Jen Lin, Taipei, TW;
Wen-Tsai Tsai, Taipei, TW;
Shun-Chung Kuo, Taipei, TW;
Yang Tai, Taipei, TW;
Wei-Yang Chen, Taipei, TW;
Chien-Tse Fang, Taipei, TW;
Po-Chia Huang, Taipei, TW;
Jiun-Wei Wu, Taipei, TW;
Yu-Cheng Lin, Taipei, TW;
Shao-Chun Hsu, Taipei, TW;
TMY Technology Inc., Taipei, TW;
Abstract
Provided is a rapid over-the-air (OTA) production line test platform, including a device under test (DUT), an antenna array and two reflecting plates. The DUT has a beamforming function. The antenna array is arranged opposite to the DUT, and emits beams with beamforming. Two reflecting plates are disposed opposite to each other, and are arranged between the DUT and the antenna array. The beam OTA test of the DUT is carried out by propagation of the beams between the antenna array, the DUT and the two reflecting plates. Accordingly, the test time can be greatly shortened and the cost of test can be effectively reduced. In addition to the above-mentioned rapid OTA production line test platform, platforms for performing the OTA production line test by using horn antenna arrays together with bending waveguides and using a 3D elliptic curve are also provided.