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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11600537 B1

PDFFull Text
Date of Patent:
Mar. 07, 2023

Filed:

Dec. 09, 2020

Magnetic property measuring system, a method for measuring magnetic properties, and a method for manufacturing a magnetic memory device using the same

Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventor:

Eunsun Noh, Yongin-si, KR;

Assignee:

Samsung Electronics Co., Ltd.;

Attorney:

Myers Bigel, P.A.

Primary Examiner:

Thanh T Nguyen

Int. Cl.
CPC ...
H01L 43/12 (2006.01); H01L 21/66 (2006.01); H01F 41/34 (2006.01); H01L 21/683 (2006.01); G01R 33/032 (2006.01); H01F 10/32 (2006.01); H01L 27/22 (2006.01); G01R 33/12 (2006.01); H01L 43/02 (2006.01);
U.S. Cl.
CPC ...
H01L 22/14 (2013.01); G01R 33/0325 (2013.01); G01R 33/1207 (2013.01); H01F 10/3254 (2013.01); H01F 10/3286 (2013.01); H01F 41/34 (2013.01); H01L 21/6838 (2013.01); H01L 27/228 (2013.01); H01L 43/02 (2013.01); H01L 43/12 (2013.01);
Abstract

A magnetic property measuring system includes a stage configured to hold a sample and a magnetic structure disposed over the stage. The stage includes a body part, a magnetic part adjacent the body part, and a plurality of holes defined in the body part. The magnetic part of the stage and the magnetic structure are configured to apply a magnetic field, which is perpendicular to one surface of the sample, to the sample. The stage is configured to move horizontally in an x-direction and a y-direction which are parallel to the one surface of the sample.

Find Patent Forward Citations

Noh, Eunsun. (2023). Magnetic property measuring system, a method for measuring magnetic properties, and a method for manufacturing a magnetic memory device using the same (U.S. Patent No. 11600537). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11600537

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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