The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2023
Filed:
Jul. 29, 2021
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Bunta Matsuhana, Kyoto, JP;
Goro Kambe, Kyoto, JP;
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 7/00 (2006.01); G06T 7/00 (2017.01); H04N 5/32 (2023.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G01T 7/00 (2013.01); H04N 5/32 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/30168 (2013.01);
Abstract
A deterioration determination method in a deterioration determination device configured to determine deterioration of an X-ray detector of an industrial X-ray imaging apparatus, the deterioration determination method including: an acquisition step of acquiring a captured image generated by the X-ray detector; a statistical processing step of generating statistical processing information of the captured image; and a determination step of determining whether or not the X-ray detector has been deteriorated, based on the statistical processing information.