The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Jun. 29, 2021
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Kyungjoo Noh, Pasadena, CA (US);

Christopher Chamberland, Pasadena, CA (US);

Fernando Brandao, Pasadena, CA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 10/70 (2022.01); G06F 11/10 (2006.01); G06N 10/00 (2022.01);
U.S. Cl.
CPC ...
G06N 10/70 (2022.01); G06F 11/104 (2013.01); G06N 10/00 (2019.01);
Abstract

A fault tolerant quantum error correction protocol is implemented for a surface code comprising Gottesman Kitaev Preskill (GKP) qubits. Analog information is determined when measuring position or momentum shifts, wherein the analog information indicates a closeness of the shift to a decision boundary. The analog information may further be used to determine confidence values for error corrected measurements from the GKP qubits of the surface code.


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Noh, Kyungjoo. (2023). Fault-tolerant quantum error correction with a surface gkp code (U.S. Patent No. 11599820). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11599820

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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