The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Jul. 21, 2017
Applicant:

Landmark Graphics Corporation, Houston, TX (US);

Inventors:

Yogendra Narayan Pandey, Houston, TX (US);

Keshava Prasad Rangarajan, Sugar Land, TX (US);

Jeffrey Marc Yarus, Houston, TX (US);

Naresh Chaudhary, Sugar Land, TX (US);

Nagaraj Srinivasan, Sugar Land, TX (US);

James Etienne, Abingdon, GB;

Assignee:

Landmark Graphics Corporation, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G01V 99/00 (2009.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G01V 99/005 (2013.01); G06K 9/6256 (2013.01); G06K 9/6262 (2013.01);
Abstract

Embodiments of the subject technology for deep learning based reservoir modelling provides for receiving input data comprising information associated with one or more well logs in a region of interest. The subject technology determines, based at least in part on the input data, an input feature associated with a first deep neural network (DNN) for predicting a value of a property at a location within the region of interest. Further, the subject technology trains, using the input data and based at least in part on the input feature, the first DNN. The subject technology predicts, using the first DNN, the value of the property at the location in the region of interest. The subject technology utilizes a second DNN that classifies facies based on the predicted property in the region of interest.


Find Patent Forward Citations

Loading…