The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Dec. 18, 2017
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

Ming Lei, Ellicott City, MD (US);

Catalin Popescu, Atlanta, GA (US);

Assignee:

ORACLE INTERNATIONAL CORPORATION, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 30/02 (2012.01); G06K 9/62 (2022.01); G06F 17/10 (2006.01); G06Q 50/28 (2012.01); G06N 20/00 (2019.01); G06Q 30/0202 (2023.01); G06V 10/98 (2022.01);
U.S. Cl.
CPC ...
G06K 9/6262 (2013.01); G06F 17/10 (2013.01); G06K 9/6256 (2013.01); G06K 9/6269 (2013.01); G06N 20/00 (2019.01); G06Q 30/0202 (2013.01); G06Q 50/28 (2013.01); G06V 10/98 (2022.01);
Abstract

Embodiments generate a model of demand of a product that includes an optimized feature set. Embodiments receive sales history for the product and receive a set of relevant features for the product and designate a subset of the relevant features as mandatory features. From the sales history, embodiments form a training dataset and a validation dataset and randomly select from the set of relevant features one or more optional features. Embodiments include the selected optional features with the mandatory features to create a feature test set. Embodiments train an algorithm using the training dataset and the feature test set to generate a trained algorithm and calculate an early stopping metric using the trained algorithm and the validation dataset. When the early stopping metric is below a predefined threshold, the feature test set is the optimized feature set.


Find Patent Forward Citations

Lei, Ming. (2023). Dynamic feature selection for model generation (U.S. Patent No. 11599753). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11599753

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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