The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Jun. 14, 2019
Applicant:

The Board of Regents of the University of Texas System, Austin, TX (US);

Inventors:

Tongping Liu, San Antonio, TX (US);

Hongyu Liu, San Antonio, TX (US);

Sam Albert Silvestro, San Antonio, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 9/38 (2018.01); G06F 9/30 (2018.01);
U.S. Cl.
CPC ...
G06F 11/3612 (2013.01); G06F 9/30098 (2013.01); G06F 9/3861 (2013.01);
Abstract

The techniques described herein may provide techniques for precise and fully-automatic on-site software failure diagnosis that overcomes issues of existing systems and general challenges of in-production software failure diagnosis. Embodiments of the present systems and methods may provide a tool capable of automatically pinpointing a fault propagation chain of program failures, with explicit symptoms. The combination of binary analysis, in-situ/identical replay, and debugging registers may be used together to simulate the debugging procedures of a programmer automatically. Overhead, privacy, transparency, convenience, and completeness challenges of in-production failure analysis are improved, making it suitable for deployment uses.


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