The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Dec. 03, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Yuk L. Chan, Rochester, NY (US);

Tian Wu, Beijing, CN;

Jia Qi Li, Beijing, CN;

Zhi Shuai Han, Beijing, CN;

Lei Yu, Sleepy Hollow, NY (US);

Hong Min, Hopewell Junction, NY (US);

Fan Jing Meng, Beijing, CN;

Abhishek Dokania, Hilliard, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 16/245 (2019.01); G06Q 10/10 (2012.01);
U.S. Cl.
CPC ...
G06F 11/0781 (2013.01); G06F 11/076 (2013.01); G06F 11/079 (2013.01); G06F 16/245 (2019.01); G06Q 10/10 (2013.01);
Abstract

According to an aspect, a method includes searching for a correlated log identifier in a correlation database based on detecting a metrics-based anomaly. The method also includes providing, in a problem diagnosis, related log information associated with the correlated log identifier based on locating one or more log entries including the correlated log identifier in a same time window as the metrics-based anomaly. The method further includes searching for a correlated metric in the correlation database based on detecting a log-based anomaly and providing, in the problem diagnosis, related metric information associated with the correlated metric based on locating one or more metrics records including the correlated metric in the same time window as the log-based anomaly.


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