The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2023
Filed:
Oct. 14, 2020
Lawrence Livermore National Security, Llc, Livermore, CA (US);
Tiziana C. Bond, Livermore, CA (US);
Matthew A. Horsley, Danville, CA (US);
Shervin Kiannejad, Brentwood, CA (US);
Ted Laurence, Livermore, CA (US);
Ty Samo, Walnut Creek, CA (US);
Peter Weber, Berkeley, CA (US);
Xiyu Yi, Livermore, CA (US);
LAWRENCE LIVERMORE NATIONAL SECURITY, LLC, Livermore, CA (US);
Abstract
Devices, systems and methods for widefield three-dimensional (3D) microscopy with a quantum entanglement light source are described. An example method includes generating a first set of photons and a second set of photons, wherein each of the photons in the first set is quantum entangled with a corresponding photon in the second set, directing the second set of photons toward a sample and simultaneously directing the first set of photons toward a first two-dimensional (2D) detector, detecting, from the sample, a plurality of photons at a second 2D detector, analyzing detections from the first and second 2D detectors to determine coincidence information, and determining one or more characteristics associated with at least a three-dimensional (3D) section of the sample based on collective detections at the first and the second 2D detectors.