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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11598873 B1

PDFFull Text
Date of Patent:
Mar. 07, 2023

Filed:

Jan. 07, 2019

Optical apparatus for scanning an object with illumination light flux to detect reflected light flux from the object, and on-board system and mobile apparatus including the same

Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Tomoaki Kawakami, Utsunomiya, JP;

Assignee:

CANON KABUSHIKI KAISHA, Tokyo, JP;

Attorney:

Rossi, Kimms & McDowell LLP

Primary Examiner:

Sung H Pak

Int. Cl.
CPC ...
G02B 6/28 (2006.01); G02B 27/30 (2006.01); G01S 17/42 (2006.01); G01S 17/931 (2020.01); G01C 3/04 (2006.01); B60T 8/171 (2006.01); G01S 17/89 (2020.01);
U.S. Cl.
CPC ...
G01S 17/42 (2013.01); G01C 3/04 (2013.01); G01S 17/931 (2020.01); G02B 6/2817 (2013.01); G02B 27/30 (2013.01); B60T 8/171 (2013.01); G01S 17/89 (2013.01);
Abstract

Provided is a detecting apparatus including a light source emitting an illumination light flux, a light receiving element receiving a reflected light flux from an object, a deflection unit deflecting illumination light flux toward the object to scan the object and deflecting reflected light flux toward light receiving element, a splitting unit allowing illumination light flux from light source to proceed toward deflection unit and allowing reflected light flux from deflection unit to proceed toward light receiving element, and a first telescope increasing a diameter of illumination light flux deflected by deflection unit, and decreasing a diameter of reflected light flux from the object in which the deflection unit is arranged so that a light path of a principal ray of illumination light flux at a center angle of view in a scanning range of deflection unit is prevented from coinciding with an optical axis of first telescope.

Find Patent Forward Citations

Kawakami, Tomoaki. (2023). Optical apparatus for scanning an object with illumination light flux to detect reflected light flux from the object, and on-board system and mobile apparatus including the same (U.S. Patent No. 11598873). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11598873

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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