The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2023
Filed:
Apr. 30, 2019
Topcon Corporation, Tokyo-to, JP;
Fumio Ohtomo, Saitama, JP;
Kaoru Kumagai, Tokyo-to, JP;
TOPCON Corporation, Tokyo-to, JP;
Abstract
A surveying system comprises an object to be measured having a retro-reflector and a surveying instrument main body for emitting a distance measuring light and performing a measurement based on a reflected distance measuring light, wherein the surveying instrument main body comprises a distance measuring light projecting module, a photodetector, a measuring unit, an optical axis deflector which has a reference optical axis and deflects a distance measuring optical axis, a projecting direction detecting module which detects a deflection angle and a deflection angle direction of the distance measuring optical axis, and an arithmetic control module, and wherein the arithmetic control module is configured to control the optical axis deflector, to perform a two-dimensional scan with the distance measuring light, to detect the deflection angle direction of the distance measuring light at a moment of detecting a photodetecting signal by the projecting direction detecting module, and to move an approximate center of the two-dimensional scan in the detected deflection angle direction.