The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2023
Filed:
Nov. 26, 2019
Applicant:
Icagen, Inc., Durham, NC (US);
Inventors:
Benjamin P. Warner, Durham, NC (US);
Chang-Tai Hsieh, Durham, NC (US);
Emilia Solomon, Durham, NC (US);
Lori Peterson, Durham, NC (US);
Douglas Krafte, Durham, NC (US);
Nathan Zahler, Durham, NC (US);
Assignee:
Icagen, LLC, Emeryville, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); G01N 33/18 (2006.01); G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
G01N 33/182 (2013.01); G01N 23/223 (2013.01); G01N 33/1813 (2013.01); G01N 2223/076 (2013.01);
Abstract
Methods, apparatus and compositions are described for the measurement of metal and/or metalloid elements, including selenium in samples. More specifically, the present disclosure provides a sensor and/or array of sensors to measure metal and/or metalloid analytes, e.g., sensor and/or array of sensors having a chelator molecule, the chelator molecule including a peptide.