The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Jun. 03, 2021
Applicant:

Computational Systems, Inc., Knoxville, TN (US);

Inventors:

Anthony J. Hayzen, Knoxville, TN (US);

Stewart V. Bowers, III, Knoxville, TN (US);

Assignee:

Computational Systems, Inc., Knoxville, TN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G01N 29/44 (2006.01); G01N 29/46 (2006.01); G01N 29/14 (2006.01);
U.S. Cl.
CPC ...
G01N 29/4463 (2013.01); G01N 29/14 (2013.01); G01N 29/46 (2013.01);
Abstract

A computer implemented method processes time waveform machine vibration data that are indicative of operational characteristics of a machine. The data, which were measured on the machine over a period of time having a begin time and an end time, are accessed from a memory or storage device. An integer number M of waveform samples are determined from the data to be averaged, and an asymptotically decaying DC bias component in the data is derived using a moving average of the M number of waveform samples. The DC bias component is extrapolated from the begin time of the waveform back to an earlier time and from the end time of the waveform forward to a later time. The DC bias component is then subtracted from the time waveform data, and a Fast Fourier Transform is performed on the data to generate a spectrum.


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