The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Jan. 25, 2021
Applicant:

Toshiba Energy Systems & Solutions Corporation, Kawasaki, JP;

Inventors:

Noriyasu Kobayashi, Yokohama Kanagawa, JP;

Jun Semboshi, Yokohama Kanagawa, JP;

Megumi Akimoto, Tokyo, JP;

Masaru Ukai, Yokohama Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/904 (2021.01);
U.S. Cl.
CPC ...
G01N 27/904 (2013.01);
Abstract

An eddy current flaw detection device according to an embodiment includes: a first exciter/detector that is supplied with alternating current and can induce eddy current in a tested object by generating a magnetic field change in the tested object; a second exciter/detector disposed opposite side of the first exciter/detector sandwiching the tested object therebetween. The second exciter/detector can detect a change in a reactive magnetic field generated by the eddy current. The first and second exciter/detectors each may have a coil including a helical coil wire, and the coil wire of the first exciter/detector may be thicker than the coil wire of the second exciter/detector.


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