The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Jun. 26, 2020
Applicant:

Analogic Corporation, Peabody, MA (US);

Inventors:

Zhaolin Li, Malden, MA (US);

David Lieblich, Worcester, MA (US);

Assignee:

Analogic Corporation, Peabody, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); A61B 6/00 (2006.01); G01N 23/046 (2018.01); G06T 11/00 (2006.01); G06T 17/00 (2006.01); G06T 19/20 (2011.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G06T 11/006 (2013.01); G06T 11/008 (2013.01); G06T 17/00 (2013.01); G06T 19/20 (2013.01); G06T 2211/408 (2013.01); G06T 2211/424 (2013.01); G06T 2211/436 (2013.01); G06T 2219/2004 (2013.01); G06T 2219/2021 (2013.01);
Abstract

Among other things, one or more techniques and/or systems for generating a three-dimensional combined image is provided. A three-dimensional test image of a test item is combined with a three-dimensional article image of an article that is undergoing a radiation examination to generate the three-dimensional combined image. A first selection region of the three-dimensional article image is selected. The three-dimensional test image of the test item is inserted within the first selection region. Although the test item is not actually comprised within the article under examination, the three-dimensional combined image is intended to cause the test item to appear to be comprised within the article.


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