The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Sep. 18, 2019
Applicant:

Osram Oled Gmbh, Regensburg, DE;

Inventors:

Christian Leirer, Friedberg, DE;

Christian Mueller, Deuerling, DE;

Ulrich Steegmüller, Regensburg, DE;

Assignee:

OSRAM OLED GMBH, Regensburg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01J 3/10 (2006.01); G01J 3/28 (2006.01); G01J 3/42 (2006.01); G01N 21/31 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0256 (2013.01); G01J 3/10 (2013.01); G01J 3/2803 (2013.01); G01J 3/42 (2013.01); G01N 21/31 (2013.01); G01J 2003/2806 (2013.01); G01J 2003/425 (2013.01); G01N 2201/0221 (2013.01); G01N 2201/062 (2013.01);
Abstract

In an embodiment a measuring unit includes a light emitting LED component including a housing occupying a housing surface G and an LED chip located within the housing, the LED chip including a light emitting light surface L and being configured to emit light; a photodetector configured to detect reflected light reflected from a measured object originating from the LED component and output a measurement signal dependent on a detection of the reflected light; and an integrated circuit configured to evaluate the measurement signal, wherein the LED component, the photodetector, and the integrated circuit are combined into an integrated unit; and a conversion layer disposed in the housing and located above the LED chip, the conversion layer configured to convert the light into multiband light, wherein a ratio L/G of is greater than or equal to 0.8, and wherein the measuring unit is configured to optically measure at least one property of the measured object.


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